4th International PV Module Quality Assurance Forum
October 10, 2013
Presentations are available for download:
- Welcome—Takahiro Wada, Ryukoku University
- Welcome—Tony Sample, JRC
- Japan's FIT Program and PV Reliability Assurance—Eiji Yamada, JET
- Differences between Qualification Tests, Comparative Tests and Service Life Predictions and How They Use Accelerated Stress Tests in Different Ways—John Wohlgemuth, NREL
- Results of Field Tests in Japan—Hiroshi Kato, JET
- Cutting Edge Quality Assurance for Technical Bankability VDE Quality Tested Program—Hideki Nishimura, VDE
- Accelerated Degradation Test for Commercial PV Modules—Shinji Kawai, SAGA-ITC
- PV+ Test—Jörg Althaus, TUV Rheinland
- Task Group 1: Progress Report—Yoshihito Eguchi, JET
- Thermal Runaway Test for Bypass Diode—Y. Uchida, JET
- Status of Task Gr. 8: Region Japan—Keizo Asaoka, Kaneka Corporation
- Proposal for Comparative PV Module Rating System—John Wohlgemuth, NREL